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Hirotaka SatoFaculty of Engineering
Associate ProfessorResearch Layer- Analysis
- Applied Systems Creation
Keyword- Cosmic ray
- Neutron
- Gamma ray
- Electron beam
- Radiation damage
- Single event effect
- Soft error
- Semiconductor system error
- Accelerated testing
- System level radiation irradiation
Keyword- Cosmic ray
- Neutron
- Gamma ray
- Electron beam
- Radiation damage
- Single event effect
- Soft error
- Semiconductor system error
- Accelerated testing
- System level radiation irradiation
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Kazuhisa SueokaFaculty of Information Science and Technology
ProfessorResearch Layer- Process
- Analysis
Keyword- Scanning probe microscopy
- Surface atomic structure measurement
- Magnetic field sensors
- Surface spin state measurement/Spin-dependent spectroscopy
- Micromagnetic field measurement
Keyword- Scanning probe microscopy
- Surface atomic structure measurement
- Magnetic field sensors
- Surface spin state measurement/Spin-dependent spectroscopy
- Micromagnetic field measurement
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Norihito SakaguchiFaculty of Engineering
Associate ProfessorResearch Layer- Analysis
Keyword- Nano insulator characterisation
- visualisation of 3D dopant distribution
- sub-nano electronic structure analysis
Keyword- Nano insulator characterisation
- visualisation of 3D dopant distribution
- sub-nano electronic structure analysis
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Takashi KamiyamaFaculty of Engineering
ProfessorResearch Layer- Analysis
- Applied Systems Creation
Keyword- Cosmic ray
- Neutron
- Gamma ray
- Electron beam
- Radiation damage
- Single event effect
- Soft error
- Semiconductor system error
- Accelerated testing
- System level radiation irradiation
Keyword- Cosmic ray
- Neutron
- Gamma ray
- Electron beam
- Radiation damage
- Single event effect
- Soft error
- Semiconductor system error
- Accelerated testing
- System level radiation irradiation
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Tamaki ShibayamaFaculty of Engineering
ProfessorResearch Layer- Analysis
Keyword- Cs-corrected STEM
- High Resolution TEM
- EDS
- EELS
- SEM
- FIB
- Wide-gap semiconductors
- Compound semiconductors
- Ion irradiation
- Radiation defects
- Residual elastic strain
- Insulating films
- Interfaces
- in-situ IV measurements
Keyword- Cs-corrected STEM
- High Resolution TEM
- EDS
- EELS
- SEM
- FIB
- Wide-gap semiconductors
- Compound semiconductors
- Ion irradiation
- Radiation defects
- Residual elastic strain
- Insulating films
- Interfaces
- in-situ IV measurements
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Yasunori TodaFaculty of Engineering
ProfessorResearch Layer- Analysis
Keyword- time-resolved spectroscopy
- photo-induced phase transition
- high-temperature superconductivity
- exciton
- optical vortex
Keyword- time-resolved spectroscopy
- photo-induced phase transition
- high-temperature superconductivity
- exciton
- optical vortex
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Yasutaka MatsuoResearch Institute for Electronic Science
ProfessorResearch Layer- Process
- Analysis
Keyword- Atomic Layer Deposition
- Time resolved PEEM
- Characterization of Organic/Inorganic interface
- Development of Nanoprocessing
Keyword- Atomic Layer Deposition
- Time resolved PEEM
- Characterization of Organic/Inorganic interface
- Development of Nanoprocessing
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Yoshinori NishinoResearch Institute for Electronic Science
ProfessorResearch Layer- Analysis
Keyword- X-ray nano-imaging/nano-CT
- Coherent X-ray imaging
- Synchrotron Radiation
- X-ray free-electron laser
Keyword- X-ray nano-imaging/nano-CT
- Coherent X-ray imaging
- Synchrotron Radiation
- X-ray free-electron laser
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Yuji KunisadaFaculty of Engineering
Associate ProfessorResearch Layer- Analysis
Keyword- first-principles calculations
- ceramics
- electronic structure
- dopants
- diffusion
- catalysis
Keyword- first-principles calculations
- ceramics
- electronic structure
- dopants
- diffusion
- catalysis