Tamaki Shibayama
Faculty of Engineering
Professor
Professor
Keyword
- Cs-corrected STEM
- High Resolution TEM
- EDS
- EELS
- SEM
- FIB
- Wide-gap semiconductors
- Compound semiconductors
- Ion irradiation
- Radiation defects
- Residual elastic strain
- Insulating films
- Interfaces
- in-situ IV measurements